Mutlu, ZaferMutlu, Yaşar G.Yılmaz, MücahitDoğan, OğuzÖzkan, MihrimahÖzkan, Cengiz S.2020-03-262020-03-262012Mutlu, Z., Mutlu, Y. G., Yılmaz, M., Doğan, O., Özkan, M., Özkan, C. S., (2012). Fabrication and Surface Morphology of YBCO Superconducting Thin Films on STO Buffered Si Substrates. Materials Research Society Symposium Proceedings, 1454, 129-134. DOI: 10.1557/opl.2012.10699.78161E+120272-9172https://dx.doi.org/10.1557/opl.2012.1069https://hdl.handle.net/20.500.12395/287712012 MRS Spring Meeting -- 9 April 2012 through 13 April 2012 -- San Francisco, CA -- 93072Pulsed Electron Deposition (PED) is an attractive alternative to Pulsed Laser Deposition (PLD) for growing high temperature superconductor thin films because of its relatively low cost. In this study, YBa2Cu3O7-? (YBCO) thin film has been fabricated on silicon substrates by Pulsed Electron Deposition technique. SrTiO3 (STO) as a buffer layer has been grown between Si substrate and YBCO superconducting layer. The crystalline structures of STO/Si and YBCO/STO/Si films have been investigated by x-ray diffraction (XRD). The surface morphology and microstructure of YBCO/STO/Si thin film have been characterized with atomic force microscope (AFM) and scanning electron microscope (SEM). From the ?-2? XRD analysis of YBCO thin films, (00l) diffraction peaks are obtained indicating they have a poor c-axis oriented structure. SEM analysis shows that the surfaces of films are crack-free, but they have some particulates. On AFM images, the droplets are clearly observed leading to a roughly surface.en10.1557/opl.2012.1069info:eu-repo/semantics/closedAccessConference Object1454129134N/A