Aksakallı, Sertaçİleri, ZehraYavuz, TevfikMalkoç, Meral ArslanÖztürk, Nilgün2020-03-262020-03-2620150268-89211435-604Xhttps://dx.doi.org/10.1007/s10103-014-1682-5https://hdl.handle.net/20.500.12395/32438The purpose of this in vitro study was to evaluate and compare the effects of different surface treatments and laser irradiation on the bond strength of brackets bonded to porcelain laminate veneer. Porcelain laminate veneer specimens were embedded in the centers of acrylic resin blocks. Thirty-nine teeth were used for shear bond strength testing and the remaining three (one tooth for each group) were used for evaluation of the debonded bracket interface. Specimens were randomly divided into three groups, each containing 13 specimens. The details of the groups are as follows: Group SB, sandblasting with alumina particles (50 mu m); Group HFA, 9.6 % hydrofluoric acid etching; Group ER, erbium-doped yttrium-aluminum-garnet (Er: YAG) irradiation (from 1 mm distance, 2 W, 10 Hz for 10 s). After conditioning, the upper central brackets were bonded to the porcelain surfaces. Porcelain laminate veneers were examined under stereomicroscope for adhesive remnant index and surface damage after debonding. The highest shear bond strength values were obtained with Group HFA (10.8 +/- 3.8 MPa) and Group ER (9.3 +/- 1.5 MPa), whereas Group SB revealed the lowest values. Scanning electron microscopy energy-dispersive X-ray (SEM-EDX) analysis revealed that the silicon level in the porcelain decreased after debonding in all groups. The sandblasting method did not demonstrate any ideal bond strength values; however, the 9.6 % hydrofluoric acid etching and Er: YAG laser did. There were no significant differences among all groups in terms of laminate surface damages. The Er: YAG laser therefore can be selected for ideal bond strength and minimal damage to porcelain laminates.en10.1007/s10103-014-1682-5info:eu-repo/semantics/closedAccessLaserLaminateOrthodonticsBondingDentistryPorcelain laminate veneer conditioning for orthodontic bonding: SEM-EDX analysisArticle3071829183425344891Q2WOS:000360863300003Q2