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    Analysis of temperature dependent electrical properties of Au/perylene-diimide/n-Si Schottky diodes
    (ELSEVIER SCIENCE SA, 2013) Yuksel, O. F.; Tugluoglu, N.; Safak, H.; Nalcacigil, Z.; Kus, M.; Karadeniz, S.
    The electrical properties of Au/perylene-diimide/n-Si Schottky diode have been determined by means of current-voltage measurements in the temperature range of 75-300 K. These devices showed good rectifying behavior and the temperature dependence of the current-voltage characteristics could be explained by thermionic emission mechanism. The experimental values of barrier height and ideality factor for device have been calculated as 0.168 eV and 7.63 eV at 75 K and 0.690 eV and 1.57 eV at 300 K, respectively. The fabricated Schottky diode shows non-ideal current-voltage behavior and so it is thought that the device have a metal-interface layer-semiconductor configuration. In addition to current-voltage measurements, the room temperature capacitance-voltage characteristics of Au/perylene-diimide/n-Si devices were also investigated. The barrier height value of 1.051 eV obtained from the capacitance-voltage measurements was found to be higher than that of 0.690 eV obtained from the current-voltage measurements at room temperature. Furthermore, the energy distribution of the interface state density determined from current-voltage characteristics increases exponentially with bias from 8.01 x 10(12) eV(-1) cm(-2) at ( E-c - 0.666) eV to 5.86 x 10(13) eV(-1) cm(-2) at (E-c - 0.575) eV. (C) 2013 Elsevier B. V. All rights reserved.
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    Frequency dependent interface state properties of a Schottky device based on perylene-monoimide deposited on n-type silicon by spin coating technique
    (ELSEVIER SCI LTD, 2013) Tugluoglu, N.; Yuksel, O. F.; Karadeniz, S.; Safak, H.
    We have reported a detailed investigation of frequency dependent properties of the Au/perylene-monoimide (PMI)/n-Si Schottky diodes in this study. Schottky diodes based on PMI have been fabricated by spin coating method. The capacitance-voltage (C-V) and conductance-voltage (G-V) characteristics have been measured in the frequency range from 30 kHz to 1 MHz at room temperature. The values of measured capacitance C-m and conductance G(m) under both reverse and forward bias have been corrected for the effect of series resistance to obtain the real diode capacitance and the conductance values. The density of interface states (D-it) distribution profiles as a function of frequency has been extracted from the corrected C-V and G-V measurements. Interface trap states of the PMI/n-Si Schottky device have decreased by increasing the applied frequency and were found to be 8.13 x 10(11) and 1.75 x 10(11) eV(-1) cm(-2) for 30 kHz and 1 MHz, respectively. (C) 2013 Elsevier Ltd. All rights reserved.