Sift-based Iris Recognition Using Sub-Segments

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dc.contributor.authorMesecan, Ibrahim
dc.contributor.authorEleyan, Alaa
dc.contributor.authorKarlik, Bekir
dc.date.accessioned2020-03-26T18:43:22Z
dc.date.available2020-03-26T18:43:22Z
dc.date.issued2013
dc.departmentSelçuk Üniversitesien_US
dc.descriptionInternational Conference on Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE) -- MAY 09-11, 2013 -- Mevlana Univ, Konya, TURKEYen_US
dc.description.abstractIn this paper, we investigate the use of Scale Invariant Feature Transform (SIFT) for iris recognition problem with sub-segments. Instead of using the whole iris, we extracted sub-segments from the iris image for classification. These sub-segments were used separately for classification. Also, feature based fusion is applied using different sub-segments from the same iris. A preprocessing step for cropping the iris area from the images was address in this paper as well to increase performance of the system. The simulation results show high performance on the used database.en_US
dc.identifier.endpage353en_US
dc.identifier.isbn978-1-4673-5613-8; 978-1-4673-5612-1
dc.identifier.scopusqualityN/Aen_US
dc.identifier.startpage350en_US
dc.identifier.urihttps://hdl.handle.net/20.500.12395/29816
dc.identifier.wosWOS:000325948700066en_US
dc.identifier.wosqualityN/Aen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.relation.ispartof2013 INTERNATIONAL CONFERENCE ON TECHNOLOGICAL ADVANCES IN ELECTRICAL, ELECTRONICS AND COMPUTER ENGINEERING (TAEECE)en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.selcuk20240510_oaigen_US
dc.subjectiris recognitionen_US
dc.subjectscale invariant feature transformen_US
dc.subjectfusionen_US
dc.titleSift-based Iris Recognition Using Sub-Segmentsen_US
dc.typeConference Objecten_US

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