Thickness dependence of dispersion parameters of the MoOx thin films prepared using the vacuum evaporation technique

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dc.contributor.authorAkın, Ümmühan
dc.contributor.authorŞafak, Haluk
dc.date.accessioned2020-03-26T19:07:43Z
dc.date.available2020-03-26T19:07:43Z
dc.date.issued2015
dc.departmentSelçuk Üniversitesien_US
dc.description.abstractThe optical behaviors of molybdenum oxide thin films are highly important due to their widespread applications. In the present paper, the effect of thickness on the structure, morphology and optical properties of molybdenum oxide (MoOx) thin films prepared on Corning glass substrates using thermal evaporation technique was studied. The structure and morphology of films were characterized using Xray diffraction (XRD) and scanning electron microscopy (SEM), respectively, while their optical properties were investigated by UV-VIS-NIR spectrophotometry in the spectral range from 300 to 2500 nm. It was observed that whole films have amorphous structure and also they showed rather high transmittance values reached nearly up to 90%. Absorption analysis showed two types of electronic transitions; both direct and indirect interband transition energy values of films decrease from 4.47 to 3.45 eV and from 3.00 to 2.75 eV, respectively, with increasing the film thickness, while the width of the localized states tail increases with thickness. This decrease in the band gap value can be attributed to the rising oxygenion vacancy densities with the thickness. The refractive indices of films were calculated from Sellmeier coefficients determined by nonlinear curve fitting method based on the measured transmittance spectral data. The dispersion of the refractive index was discussed in terms of the Wemple-DiDomenico singleos-cillator model. The dispersion parameters such as average oscillator energy, E-o, the dispersion energy, E-d, and static refractive index n(o) were evaluated and they found to vary significantly with the film thickness. (C) 2015 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipSelcuk University BAP officeSelcuk Universityen_US
dc.description.sponsorshipThis work is partially supported by Selcuk University BAP office.en_US
dc.identifier.doi10.1016/j.jallcom.2015.06.164en_US
dc.identifier.endpage151en_US
dc.identifier.issn0925-8388en_US
dc.identifier.issn1873-4669en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage146en_US
dc.identifier.urihttps://dx.doi.org/10.1016/j.jallcom.2015.06.164
dc.identifier.urihttps://hdl.handle.net/20.500.12395/32698
dc.identifier.volume647en_US
dc.identifier.wosWOS:000361156400021en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherELSEVIER SCIENCE SAen_US
dc.relation.ispartofJOURNAL OF ALLOYS AND COMPOUNDSen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.selcuk20240510_oaigen_US
dc.subjectOptical constantsen_US
dc.subjectDispersion analysisen_US
dc.subjectMolybdenum oxide thin filmsen_US
dc.titleThickness dependence of dispersion parameters of the MoOx thin films prepared using the vacuum evaporation techniqueen_US
dc.typeArticleen_US

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