Fabrication and Surface Morphology of YBCO Superconducting Thin Films on STO Buffered Si Substrates
Yükleniyor...
Dosyalar
Tarih
2012
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
Pulsed Electron Deposition (PED) is an attractive alternative to Pulsed Laser Deposition (PLD) for growing high temperature superconductor thin films because of its relatively low cost. In this study, YBa2Cu3O7-? (YBCO) thin film has been fabricated on silicon substrates by Pulsed Electron Deposition technique. SrTiO3 (STO) as a buffer layer has been grown between Si substrate and YBCO superconducting layer. The crystalline structures of STO/Si and YBCO/STO/Si films have been investigated by x-ray diffraction (XRD). The surface morphology and microstructure of YBCO/STO/Si thin film have been characterized with atomic force microscope (AFM) and scanning electron microscope (SEM). From the ?-2? XRD analysis of YBCO thin films, (00l) diffraction peaks are obtained indicating they have a poor c-axis oriented structure. SEM analysis shows that the surfaces of films are crack-free, but they have some particulates. On AFM images, the droplets are clearly observed leading to a roughly surface.
Açıklama
2012 MRS Spring Meeting -- 9 April 2012 through 13 April 2012 -- San Francisco, CA -- 93072
Anahtar Kelimeler
Kaynak
Materials Research Society Symposium Proceedings
WoS Q Değeri
Scopus Q Değeri
N/A
Cilt
1454
Sayı
Künye
Mutlu, Z., Mutlu, Y. G., Yılmaz, M., Doğan, O., Özkan, M., Özkan, C. S., (2012). Fabrication and Surface Morphology of YBCO Superconducting Thin Films on STO Buffered Si Substrates. Materials Research Society Symposium Proceedings, 1454, 129-134. DOI: 10.1557/opl.2012.1069
