Fabrication and Surface Morphology of YBCO Superconducting Thin Films on STO Buffered Si Substrates
dc.contributor.author | Mutlu, Zafer | |
dc.contributor.author | Mutlu, Yaşar G. | |
dc.contributor.author | Yılmaz, Mücahit | |
dc.contributor.author | Doğan, Oğuz | |
dc.contributor.author | Özkan, Mihrimah | |
dc.contributor.author | Özkan, Cengiz S. | |
dc.date.accessioned | 2020-03-26T18:32:47Z | |
dc.date.available | 2020-03-26T18:32:47Z | |
dc.date.issued | 2012 | |
dc.department | Selçuk Üniversitesi | en_US |
dc.description | 2012 MRS Spring Meeting -- 9 April 2012 through 13 April 2012 -- San Francisco, CA -- 93072 | en_US |
dc.description.abstract | Pulsed Electron Deposition (PED) is an attractive alternative to Pulsed Laser Deposition (PLD) for growing high temperature superconductor thin films because of its relatively low cost. In this study, YBa2Cu3O7-? (YBCO) thin film has been fabricated on silicon substrates by Pulsed Electron Deposition technique. SrTiO3 (STO) as a buffer layer has been grown between Si substrate and YBCO superconducting layer. The crystalline structures of STO/Si and YBCO/STO/Si films have been investigated by x-ray diffraction (XRD). The surface morphology and microstructure of YBCO/STO/Si thin film have been characterized with atomic force microscope (AFM) and scanning electron microscope (SEM). From the ?-2? XRD analysis of YBCO thin films, (00l) diffraction peaks are obtained indicating they have a poor c-axis oriented structure. SEM analysis shows that the surfaces of films are crack-free, but they have some particulates. On AFM images, the droplets are clearly observed leading to a roughly surface. | en_US |
dc.identifier.citation | Mutlu, Z., Mutlu, Y. G., Yılmaz, M., Doğan, O., Özkan, M., Özkan, C. S., (2012). Fabrication and Surface Morphology of YBCO Superconducting Thin Films on STO Buffered Si Substrates. Materials Research Society Symposium Proceedings, 1454, 129-134. DOI: 10.1557/opl.2012.1069 | |
dc.identifier.doi | 10.1557/opl.2012.1069 | en_US |
dc.identifier.endpage | 134 | en_US |
dc.identifier.isbn | 9.78161E+12 | |
dc.identifier.issn | 0272-9172 | en_US |
dc.identifier.scopusquality | N/A | en_US |
dc.identifier.startpage | 129 | en_US |
dc.identifier.uri | https://dx.doi.org/10.1557/opl.2012.1069 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12395/28771 | |
dc.identifier.volume | 1454 | en_US |
dc.indekslendigikaynak | Scopus | en_US |
dc.institutionauthor | Mutlu, Yaşar G. | |
dc.language.iso | en | en_US |
dc.relation.ispartof | Materials Research Society Symposium Proceedings | en_US |
dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.selcuk | 20240510_oaig | en_US |
dc.title | Fabrication and Surface Morphology of YBCO Superconducting Thin Films on STO Buffered Si Substrates | en_US |
dc.type | Conference Object | en_US |
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