Optical Characterisation of CuInSe2 Thin Films Prepared by Two-Stage Process
Yükleniyor...
Dosyalar
Tarih
2001
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
SPRINGER-VERLAG
Erişim Hakkı
info:eu-repo/semantics/openAccess
Özet
Optical absorption spectra of CuInSe2 chalcopyrite semiconductor films prepared using a two-stage technique were investigated. In addition to absorption measurements, energy-dispersive analysis of X-rays (EDAX) and X-ray diffraction measurements (XRD) were also performed. Direct bandgap energy values for the CuInSe2 films were derived from the variation of (alphah upsilon)(2) with energy. All the measurements were performed on samples with various Cu/In ratios. It was determined from the absorption measurements that the materials have strong absorption at the fundamental band edge. The E-g values showed an increasing trend with decreasing Cu/In ratios.
Açıklama
Anahtar Kelimeler
Kaynak
Applied Physics a-Materials Science & Processing
WoS Q Değeri
Q1
Scopus Q Değeri
Q2
Cilt
73
Sayı
3
Künye
Yüksel, Ö. F., Şafak, H., Karabıyık, H., Başol, B. M., (2001). Optical Characterisation of CuInSe2 Thin Films Prepared by Two-Stage Process. Applied Physics a-Materials Science & Processing, 73(3), 387-389. Doi:10.1007/s003390100744
