Optical constants of CuInSe2 thin films prepared by two-stage process

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Küçük Resim

Tarih

2005

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayıncı

IOP PUBLISHING LTD

Erişim Hakkı

info:eu-repo/semantics/openAccess

Özet

Thin film CuInSe2 chalcopyrite semiconductors have been prepared on glass substrates by means of two-stage process. The structural properties and atomic compositions of films were determined by energy-dispersive analysis of Xrays (EDAX) and X-ray diffraction (XRD) measurements. Reflectance and transmittance measurements were performed on the films in the photon wavelength range of 300-2200nm. The samples used in the measurements have different Cu/In ratios. The reflectance and transmittance spectra were analyzed on the basis of multiple reflection model considering the absorbing film on a non-absorbing substrate and then complex refractive-index n*(E) n(E) + ik(E) and complex dielectric constant epsilon*(E) = epsilon(1) (E) + iepsilon(2)(E) were determined. It has been concluded that the films having higher Cu/In ratios show stronger absorption at low photon energy region than those having lower Cu/In ratios.

Açıklama

Anahtar Kelimeler

Kaynak

PHYSICA SCRIPTA

WoS Q Değeri

Q2

Scopus Q Değeri

Q2

Cilt

71

Sayı

2

Künye