Temperature Dependent Current-Voltage (I-V) Characteristics of Au/N-Si (111) Schottky Barrier Diodes (SBDS) with Polyvinyl Alcohol (Co, Ni-Doped) Interfacial Layer
dc.contributor.author | Tunç, T. | |
dc.contributor.author | Dökme, I. | |
dc.contributor.author | Altındal, S. | |
dc.contributor.author | Uslu, I. | |
dc.date.accessioned | 2020-03-26T18:05:08Z | |
dc.date.available | 2020-03-26T18:05:08Z | |
dc.date.issued | 2010 | |
dc.department | Selçuk Üniversitesi | en_US |
dc.description.abstract | Current-voltage (I-V) characteristics of Au/PVA(Co,Ni-doped)/n-Si (111) SBDs have been investigated in the temperature range of 280-400 K. The zero-bias barrier height (Phi(bo)) and ideality factor (n) determined from the forward bias 1 V characteristics were found strongly depend on temperature. The forward bias semi-logarithmic I-V curves for the different temperatures have an almost common cross-point at a certain bias voltage. While the value of n decreases, the Phi(Bo) increases with increasing temperature. Therefore, we attempted to draw a Phi(bo) vs q/2kT plot to obtain evidence of a Gaussian distribution of the barrier heights, and to calculate the values of mean barrier height and standard deviation at zero bias, respectively. | en_US |
dc.identifier.citation | Tunç, T., Dökme, I., Altındal, S., Uslu, I., (2010). Temperature Dependent Current-Voltage (I-V) Characteristics of Au/N-Si (111) Schottky Barrier Diodes (SBDS) with Polyvinyl Alcohol (Co, Ni-Doped) Interfacial Layer. Optoelectronics and Advanced Materials-Rapid Communications, 4(7), 947-950. | |
dc.identifier.endpage | 950 | en_US |
dc.identifier.issn | 1842-6573 | en_US |
dc.identifier.issn | 2065-3824 | en_US |
dc.identifier.issue | 7 | en_US |
dc.identifier.scopusquality | Q4 | en_US |
dc.identifier.startpage | 947 | en_US |
dc.identifier.uri | https://hdl.handle.net/20.500.12395/25315 | |
dc.identifier.volume | 4 | en_US |
dc.identifier.wos | WOS:000281114100010 | en_US |
dc.identifier.wosquality | Q4 | en_US |
dc.indekslendigikaynak | Web of Science | en_US |
dc.indekslendigikaynak | Scopus | en_US |
dc.institutionauthor | Uslu, I. | |
dc.language.iso | en | en_US |
dc.publisher | NATL INST OPTOELECTRONICS | en_US |
dc.relation.ispartof | Optoelectronics and Advanced Materials-Rapid Communications | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.selcuk | 20240510_oaig | en_US |
dc.subject | I-V Characteristics | en_US |
dc.subject | Ideality Factor | en_US |
dc.subject | Barrier Height | en_US |
dc.subject | Interface States | en_US |
dc.title | Temperature Dependent Current-Voltage (I-V) Characteristics of Au/N-Si (111) Schottky Barrier Diodes (SBDS) with Polyvinyl Alcohol (Co, Ni-Doped) Interfacial Layer | en_US |
dc.type | Article | en_US |